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BTU CUSTOM FURNACES
COMPACT SOLID STATE CHILLERS
ESE SEMICONDUCTOR PRINTING SOLUTION
The test chamber is suitable for testing products (complete machine), components, parts, etc. have the ability to withstand rapid temperature changes. The temperature impact test can understand the impact of rapid temperature changes on the test sample once or continuously for many times. The main parameters affecting the temperature change test are the high and low temperature values in the temperature change range, the holding time of the sample at high and low temperature, and the number of cycles of the test.
• Temperature Classification: Shock Test Chamber • Series: Three-compartment • Temperature Range:-65 ℃ ~ 150 ℃ • Cooling Rate:H type is about 4 ℃ / min, M type is about 3 ℃ / min, L type is about 2 ℃ / min (- no- load average value in the range of 55 ° C
> Compact Solid State Chillers
For more information, please contact us by details below.
55/39 Soi Prasertmanukit 42, Nawamin, Buengkum, Bangkok 10230 Thailand Tel.:+66 2508 2051-2 , Fax :+66 2508 2053
Email: surasit@millennium-hitech.com