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SEMICONDUCTOR PACKAGING |
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CONTROLLED ATMOSPHERE FURNACE |
Overview | Standard Features | Available Options | Specifications | Controlled | Atmosphere Furnace | Flux Coaters | Wafer Handlers |
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Overview |
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STANDARD FEATURES INCLUDE: Flexible Configurations |
AVAILABLE OPTIONS INCLUDE: Automated Wafer Handler Option |
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Overview | Standard Features | Available Options | Specifications |
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WAFER HANDLERS MHS 812 |
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Planet 6500 - The ULTIMATE AOI system for 10µm – 38µm line / space IC substrates technologies.
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Pegasus 200S is an advanced Automated Final Inspection (AFI) system dedicated to the inspection of High-Density Interconnect Substrates (HDI-S) such as PBGA & CSP strips and other gold plated applications.
The Pegasus 200S is equipped with a new Broadband CCD camera and with two independent illumination systems; one is optimized for plated metallic surfaces (gold / silver / tin / OTC) and the other for solder mask materials. Its enhanced Image Acquisition system, along with its robust image processing engine, enables the detection of fine defects and micro-cracks on most demanding applications.
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Camtek has developed the Falcon 800 line of advanced measurement and metrology systems for inspecting bumped wafers and ensuring that bumps meet their tight dimensional tolerances.
The CTS – Camtek’s Triangulation System (patent-pending) applies a novel approach to the proven triangulation principle that improves accuracy and repeatability on a variety of bumping technologies. Broader angular coverage creates a stronger and more stable reflection from a wide range of bump shapes and materials, supporting 3D analysis of bump topography.
The Falcon 800 has been specifically designed for measuring even thefinest gold bumps. Selected high-grade certified mechanical structure and assemblies provide the stability for micron-level measurement at high speeds. The combination of the CTS capabilities, optics and specific algorithms enables meeting even the most demanding gold bump applications.Flip-Chip bumps, including solder, lead-free and copper bumps present a wide variety of shapes and textures, which create high dynamic spectral range and varying reflectivity. The combination of bright field and dark field illumination images these objects with high contrast and details that enable reliable measurement.
In addition to CTS, the Falcon 800 can be equipped with CCS – Confocal Chromatic Sensor. This submicron height sensor provides pinpoint precision to verify critical height dimension, or sample gold bump surface roughness or profile.
As a metrology instrument, the Falcon 800 has a set of built-in certified calibration and performance targets that are always available for ensuring measurement accuracy.
A comprehensive suite of SPC charts and reports supports bump defect and dimension analysis by die, wafer, and lot levels. |
Falcon 800 |
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This high-throughout system is engineered to support in-line 100% inspection at production rates. Dedicated algorithms analyze probe marks to determine their size, proximity to pad edge and number of touch-downs. When equipped with Camtek’s Confocal Chromatic Height Sensor (CCS), the Falcon 500 can even plot sampled probe mark profiles. Proprietary optics provides high resolution and contrast. Bright and dark field illuminations bring surface irregularities out while allowing normal process variations. Working together, the Falcon’s optics, illuminations
and sophisticated algorithms provide superb detection with minimal false call rate. Intelligent and intuitive recipe setup adapts detection performance to user preferences. The Falcon achieves outstanding utilization by enabling line recipe setup and defect review away from the machine, without taking production time.
The Falcon’s off-line simulator displays the effect of various detection parameters and helps optimize the inspection process. Comprehensive suite of SPC tools reports defect distribution by die, wafer and lot levels supports in process control and yield management. |
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COMPONENT PLACEMENT WORK CELL |
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Customers today need a whole solution to their packaging and assembly needs, complete with a manufacturable process—a Component Placement Work Cell (CPWC) is an ideal solution. Equipment flexibility and multi-purposing is an important advantage in today’s environment of doing more with less. As a Component Placement Work Cell (CPWC), the Model 6500 Precision Die Bonder is designed for fully automatic precision component assembly with 1.5µm placement accuracy (application dependent), making volume component assembly practical and cost effective. Accuracy and a compact footprint make it easy to fit on your production floor. |
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THE MODEL 8000 WIRE BONDER |
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The Model 8000 Wire Bonder is a fully automated thermosonic high-speed ball-and-stitch wire bonder. As the assembly method of choice for first level interconnection, it’s suitable for many aspects of packaging and component assembly, including complex hybrids, MCMs, and high reliability devices. The planarBump™ feature, a patented technology that uses gold wire to produce tailless ball bumps, also makes the Model 8000 suitable for flip chip and other advanced packaging applications. The overall precision of the Model 8000 Wire Bonder results in high yield processing of fine pitch/high wire count applications. |
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Millennium Hi-Tech Corporation Co., Ltd. © 2006 All rights reserved. |
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Millennium Hi-Tech Corporation Co., Ltd. 55/39 Navamin Rd., Klong-kum Bangkok 10230 |